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Fix unreferenced errors with mingw compiler and unit tests

Fred Sundvik 8 years ago
parent
commit
78545b9509

+ 0 - 1
quantum/keymap_common.c

@@ -169,7 +169,6 @@ void action_function(keyrecord_t *record, uint8_t id, uint8_t opt)
 }
 
 // translates key to keycode
-__attribute__ ((weak))
 uint16_t keymap_key_to_keycode(uint8_t layer, keypos_t key)
 {
     // Read entire word (16bits)

+ 4 - 1
tests/basic/keymap.c

@@ -40,4 +40,7 @@ const macro_t *action_get_macro(keyrecord_t *record, uint8_t id, uint8_t opt) {
         }
     }
     return MACRO_NONE;
-};
+};
+
+void action_function(keyrecord_t *record, uint8_t id, uint8_t opt) {
+}

+ 3 - 0
tests/test_common/matrix.c

@@ -58,3 +58,6 @@ void release_key(uint8_t col, uint8_t row) {
 void clear_all_keys(void) {
     memset(matrix, 0, sizeof(matrix));
 }
+
+void led_set(uint8_t usb_led) {
+}

+ 2 - 2
tests/test_common/test_fixture.cpp

@@ -44,8 +44,8 @@ void TestFixture::run_one_scan_loop() {
     advance_time(1);
 }
 
-void TestFixture::idle_for(uint time) {
-    for (uint i=0; i<time; i++) {
+void TestFixture::idle_for(unsigned time) {
+    for (unsigned i=0; i<time; i++) {
         run_one_scan_loop();
     }
 }

+ 1 - 1
tests/test_common/test_fixture.hpp

@@ -26,5 +26,5 @@ public:
     static void TearDownTestCase();
 
     void run_one_scan_loop();
-    void idle_for(uint ms);
+    void idle_for(unsigned ms);
 };